Products & Services
With decades of experience with domestic and international projects, Micro has solutions and the experience to help you take it to the next level.
- Custom Design & Build Burn-In Boards for all Applications, Products and Temperatures.
- Custom Design Test Systems for all Products, Applications and Devices.
The following systems are also available with Computer Controlled capability:
Capacitors: Ceramic, Tantalum and discoidal
Chip and Leaded Devices
Temperatures from -40° to +350° Celcius
- Fully Computerazied IR Leakage test systems.
- Fully Computerazied (DWV) Flash/IR Leakaege Current Tester.
- Fully Computerazied Cap/DF Tester.
- Fully Computerazied Intermittentcy Testing Systems.
- ACOL Burn-in Systems, Chip and Leaded.
- Resistor Burn-in Test Systems.
- TDDB Test Systems - up to 350° Celcius.
- Electro-migration Test Systems - up to 350° Celcius.- Metal-migration Test Systems - up to 350° Celcius.- HAST Test Systems.
- Hot Carrier Test Systems.
- Prob Station Test Systems, TDDB, Hot Carrier and Electro-